3D Measurement Topography
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Projected Grating Three-Dimensional Measurement of Surface Topography, use in surveying the three-dimensional surface topography and the distortion of object. Because this system outfit 10 time of long-distance micro zoom lens, it also may outfit the ordinary zoom lens, enables this system simultaneously to satisfy microcosmic and the macroscopic survey request.
This instrument not only may use in surveying the tiny structure Surface Topography and distortion of the micro electron, biology, micro machinery, also may use in surveying the Surface Topography and distortion of concrete structure, rock and earth test specimen, like those large-scale components surface. The system has special-purpose processing software, which causes the system measuring easier and more accurate.
Main technical specification:
Effective survey scope
Resolution:1/20 grating pitch
Real-time fringe pattern speed : 25 frame/s
Picture gathering resolution: 576W768
Black and white CCD pickup camera: Signal-to-Noise 56db C connection outfit import manual zoom lens 12.5~75mm
Microcosmic survey use 10 time manual zoom lens
Picture gathering card
Processing software for phase-shift three-dimensional distortion