Testing instrument for rohs, plating thickness, whole element analtsis
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Design for RoHS Testing, Whole-Element Analysis & Plating Thickness
Precision: 0.05% (for sample content﹥96%)
Element Tested: from S to U
High Voltage: 5-50kV Tube Current: 50-1000uA
Testing Time: 60-300 seconds Relative Humidity: <=70%
Input voltage: AC 110V / 220V
Testing Substance: Powder, Solid, Liquid
Change collimators automatically. Multi-function by inserting new softwares
According to the different samples, you can switch the collimator and filter automatically.
Specialized lighting system is for you to observe the samples more conveniently.
Multi-function for RoHS testing and anglicizing the plating thickness and whole-elements
We use the semiconductor silicon electric cooling system instead of liquid nitrogen cooling system.
Special developed software, user-friendly operation interface.
High definition build-in camera for users to monitor the sample in real time.
Accurate move-platform enables the user to adjust the sample position precisely and conveniently.
Nobleness and modern outlook give you a new vision attraction.
Big sample chamber with no limit for the sample size.
Elements can be analyzed from S to U.
Analysis contents of elements from 1ppm to 99.9%.
The limited detection hazardous elements
(only aim at Cd/Pb/Cr/Hg/Br) are up to 1ppm.
Measurement time: 60-200seconds.
Energy resolution: 16515V.
High voltage: 5~50KV.
Temperature of suitability from 15 ~30 0
Power supply: 220V15V.
Select the filter automatically.
Switch the collimator of different automatically.
Pin diode semiconductor detector.
Big sample chamber
dimension of the sample chamber: 1000*1000*100mm
Safety protection mode with tri-level.
The correction model of relative independent matrix effect.
Multivariate nonlinearly recycle program
Arbitrary optional analysis and identification model.
Analyze 24 elements simultaneously.